GB/T 36613-2018
ActiveProbe test method for light emitting diode chips
发光二极管芯片点测方法
Application Summary AI generated
This standard specifies the probe test method for light emitting diode (LED) chips, including test conditions, procedures, and data processing. It is applied in the manufacturing and quality control of LED chips to evaluate their electro-optical parameters such as forward voltage, reverse current, and luminous flux. The standard is primarily used by semiconductor manufacturers and testing laboratories in the electronics industry for production line inspection and product certification.
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