GB/T 36477-2018
ActiveSemiconductor integrated circuit—Measuring methods for flash memory
半导体集成电路 快闪存储器测试方法
Application Summary AI generated
This standard specifies the test methods and conditions for measuring the electrical parameters and functional characteristics of flash memory devices in semiconductor integrated circuits. It is applied in the design verification, production testing, and quality inspection of flash memory products, including NAND and NOR types, used in consumer electronics, data storage, and embedded systems. The standard ensures consistent and reliable evaluation of memory performance, endurance, and data retention across manufacturing and application contexts.
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