GB/T 35010.7-2018

Active

Semiconductor die products—Part 7: XML schema for data exchange

半导体芯片产品 第7部分:数据交换的XML格式

Standard Type
GBT
ICS
31.200
CCS
L55
Status
Active
Issue Date
2018-03-15
Implementation
2018-08-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard defines an XML schema for exchanging data related to semiconductor die products, such as bare chips and wafers. It is applied in the semiconductor industry to facilitate standardized, machine-readable communication of product specifications, test results, and supply chain information between manufacturers, designers, and distributors. The schema ensures consistent data formatting for automated data exchange in design, procurement, and quality assurance processes.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.