GB/T 35010.6-2018

Active

Semiconductor die products—Part 6: Requirements for concerning thermal simulation

半导体芯片产品 第6部分:热仿真要求

Standard Type
GBT
ICS
31.200
CCS
L55
Status
Active
Issue Date
2018-03-15
Implementation
2018-08-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the requirements for thermal simulation of semiconductor die products, including modeling methods, boundary conditions, and validation procedures. It is applied in the design and development of integrated circuits and discrete semiconductor devices to predict thermal performance and ensure reliability under operating conditions. The standard is used by engineers in the electronics industry for thermal management analysis during product design and qualification testing.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.