GB/T 35007-2018
ActiveSemiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
半导体集成电路 低电压差分信号电路测试方法
Application Summary AI generated
This standard specifies the testing methods for low voltage differential signaling (LVDS) circuitry within semiconductor integrated circuits. It is applied in the electronics industry for evaluating the electrical parameters and performance of LVDS interfaces in devices such as high-speed data transceivers, display drivers, and communication modules. The standard ensures consistent measurement procedures for signal integrity, power consumption, and timing characteristics during design verification and production testing.
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