GB/T 35006-2018
ActiveSemiconductor integrated circuits—Measuring method of level converter
半导体集成电路 电平转换器测试方法
Application Summary AI generated
This standard specifies the testing methods for level converters in semiconductor integrated circuits, including parameters like input/output voltage levels, propagation delay, and power consumption. It is applied in the design, production, and quality verification of electronic devices that require voltage level translation between different logic families, such as in mixed-voltage systems, communication interfaces, and embedded systems. The standard ensures consistent measurement procedures for manufacturers and test laboratories to validate performance and reliability.
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