GB/T 34177-2017

Active

Quartz glass wafer for lithography

光刻用石英玻璃晶圆

Standard Type
GBT
ICS
81.040.30
CCS
Q35
Status
Active
Issue Date
2017-09-07
Implementation
2018-08-01
Centralized Committee
中国建筑材料联合会
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

GB/T 34177-2017 specifies the technical requirements, test methods, inspection rules, and packaging for quartz glass wafers used in lithography processes. It applies to the manufacturing of photomasks and optical components in semiconductor fabrication, where high-purity, low-defect quartz wafers are critical for precise UV light transmission and pattern transfer. The standard ensures dimensional accuracy, surface quality, and thermal stability for use in photolithography equipment within the microelectronics industry.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.