GB/T 33922-2017
ActiveWafer level test methods for MEMS piezoresistive pressure-sensitive die performances
MEMS压阻式压力敏感芯片性能的圆片级试验方法
Application Summary AI generated
This standard specifies the wafer-level test methods for evaluating the performance of MEMS piezoresistive pressure-sensitive dies, including parameters such as sensitivity, offset voltage, and linearity. It is applied during the manufacturing process of MEMS pressure sensors, specifically at the wafer fabrication stage before dicing and packaging, to ensure die quality and consistency. The standard is used by semiconductor manufacturers and testing facilities in the microelectronics industry for production monitoring and quality control.
Related Standards
GB/T 19403.1-2003
Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
GB/T 17574.10-2003
Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories
GB/Z 43510-2023
Integrated circuit TSV 3D package reliability test methods guideline
GB/T 19248-2003
Test method for measuring the resistance of package leads
GB/T 18500.2-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)
GB/T 18500.1-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)
GB/T 5965-2000
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)
GB/T 17940-2000
Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.