GB/T 33763-2017
ActiveTest method for dislocation density of sapphire single crystal
蓝宝石单晶位错密度测量方法
Application Summary AI generated
This standard specifies the test method for measuring dislocation density in sapphire single crystals, primarily using chemical etching and optical microscopy. It is applied in the metallurgy and materials science industries for quality control of sapphire substrates used in LEDs, optical windows, and semiconductor wafers. The method ensures consistency in crystal perfection assessment during manufacturing and incoming inspection.
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