GB/T 33714-2017
ActiveNanotechnology—Test method for size of nanoparticles—Atomic force microscopy
纳米技术 纳米颗粒尺寸测量 原子力显微术
Application Summary AI generated
This standard specifies the use of atomic force microscopy (AFM) for measuring the size of nanoparticles, including procedures for sample preparation, image acquisition, and data analysis. It is applied in nanotechnology research, quality control, and product development across industries such as pharmaceuticals, electronics, and materials science to ensure accurate particle size characterization. The standard is particularly relevant for laboratories and manufacturers requiring reliable nanoscale dimension measurements for regulatory compliance or performance validation.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.