GB/T 33714-2017

Active

Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy

纳米技术 纳米颗粒尺寸测量 原子力显微术

Standard Type
GBT
ICS
19.020
CCS
N04
Status
Active
Issue Date
2017-05-12
Implementation
2017-12-01
Centralized Committee
中国科学院
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the use of atomic force microscopy (AFM) for measuring the size of nanoparticles, including procedures for sample preparation, image acquisition, and data analysis. It is applied in nanotechnology research, quality control, and product development across industries such as pharmaceuticals, electronics, and materials science to ensure accurate particle size characterization. The standard is particularly relevant for laboratories and manufacturers requiring reliable nanoscale dimension measurements for regulatory compliance or performance validation.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.