GB/T 31472-2015
ActiveStandard guide to charge control and charge referencing techniques in X-ray photoelectron spectroscopy
X光电子能谱中荷电控制和荷电基准技术标准指南
Application Summary AI generated
This standard provides guidelines for managing and referencing sample charging effects during X-ray photoelectron spectroscopy (XPS) analysis, ensuring accurate binding energy measurements. It is applied in materials science, surface chemistry, and semiconductor industries for calibrating insulating or poorly conductive samples. The guide is used by analytical laboratories and quality control settings to standardize charge correction procedures and improve spectral data reliability.
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