GB/T 31470-2015
ActiveStandard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
俄歇电子能谱与X射线光电子能谱测试中确定检测信号对应样品区域的通则
Application Summary AI generated
This standard specifies the methodology for determining the effective specimen area that contributes to the detected signal in Auger electron spectroscopy (AES) and certain X-ray photoelectron spectroscopy (XPS) instruments. It is applied in materials science and surface analysis laboratories to ensure accurate spatial resolution and quantitative measurements when analyzing the chemical composition of thin films, coatings, and solid surfaces. The practice is critical for calibrating spectrometers and validating data in research, quality control, and failure analysis across industries like electronics, metallurgy, and nanotechnology.
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