GB/T 31359-2015

Active

Test methods of semiconductor lasers

半导体激光器测试方法

Standard Type
GBT
ICS
31.260
CCS
L51
Status
Active
Issue Date
2015-02-04
Implementation
2015-08-01
Centralized Committee
中国机械工业联合会
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the test methods for the optical, electrical, and thermal performance parameters of semiconductor laser devices. It is applied in the manufacturing and quality inspection of laser diodes used in fiber-optic communications, industrial processing, and medical equipment. The standard ensures consistent and reliable measurement procedures for evaluating device characteristics like output power, wavelength, and threshold current.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.