GB/T 30859-2014
ActiveTest method for warp and waviness of silicon wafers for solar cells
太阳能电池用硅片翘曲度和波纹度测试方法
Application Summary AI generated
This standard specifies the test methods for measuring the warp and waviness of silicon wafers used in solar cell manufacturing. It is applied in the photovoltaic industry to ensure wafer flatness, which directly impacts cell efficiency and yield during subsequent processing steps like printing and lamination. The methods are used for quality control in wafer production and incoming inspection for cell fabrication.
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