GB/T 30118-2013
ActiveSingle crystal wafers for surface acoustic wave (SAW) device applications―Specifications and measuring methods
声表面波（SAW）器件用单晶晶片规范与测量方法
Application Summary AI generated
This standard specifies the technical requirements, test methods, and quality acceptance criteria for single crystal wafers used in surface acoustic wave (SAW) devices. It is applied in the manufacturing and quality control of piezoelectric substrates, such as lithium niobate or lithium tantalate wafers, for SAW filters, resonators, and sensors in telecommunications and consumer electronics. The standard ensures consistent wafer properties like orientation, flatness, and defect density to guarantee device performance and reliability.
Related Standards
GB/T 12634-1990
Test methods for electroelastic constants of piezoelectric crystals
GB/T 12633-1990
Terms for the measurements of the properties of the piezoelectric crystals
GB/T 12275-1990
The rule of type designation for quartz crystal oscillators
GB/T 11320-1989
Test methods for the properties of piezoelectric ceramics--Material with the low mechanical quality factor
GB/T 11312-1989
Test methods for SAW properties of piezoelectric ceramics and crystals
GB/T 11311-1989
Test methods for the properties of piezoelectric ceramics--Test for Poisson’s ratio σE
GB/T 11310-1989
Test methods for the properties of piezoelectric ceramics--Test methods for temperature characteristics of relative free dielectric constants
GB/T 11309-1989
Test methods for the properties of piezoelectric ceramics--Quasi-static testfor piezoelectric strain content d33
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.