GB/T 28276-2012

Active

Silicon-based MEMS fabrication technology - Specification for the dissolved wafer process

硅基MEMS制造技术 体硅溶片工艺规范

Standard Type
GBT
ICS
31.200
CCS
L55
Status
Active
Issue Date
2012-05-11
Implementation
2012-12-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the technical requirements, process parameters, and quality control methods for the dissolved wafer process used in silicon-based MEMS (Micro-Electro-Mechanical Systems) fabrication. It is applied in the manufacturing of MEMS devices such as accelerometers, gyroscopes, and pressure sensors, particularly in the electronics and semiconductor industries. The standard ensures consistency and reliability during the batch production of microstructures that require precise silicon etching and wafer bonding.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.