GB/T 26074-2010
ActiveGermanium monocrystal-measurement of resistivity-DC linear four-point probe
锗单晶电阻率直流四探针测量方法
Application Summary AI generated
This standard specifies the DC linear four-point probe method for measuring the resistivity of germanium monocrystals. It is applied in the metallurgy and semiconductor materials industries for quality control and characterization of germanium wafers or ingots during production. The method ensures accurate resistivity measurements essential for evaluating material purity and electrical properties in electronic and optoelectronic applications.
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