GB/T 23413-2009

Active

Determination of crystallite size and micro-strain of nano-materials - X-ray diffraction line broadening method

纳米材料晶粒尺寸及微观应变的测定 X射线衍射线宽化法

Standard Type
GBT
ICS
19.100
CCS
N78
Status
Active
Issue Date
2009-04-01
Implementation
2009-12-01
Centralized Committee
国家标准委
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the use of X-ray diffraction line broadening to measure crystallite size and micro-strain in nano-materials. It is applied in research and quality control for nano-powders, thin films, and other nanostructured materials, particularly within materials science and nanotechnology industries. The method is essential for characterizing structural properties that influence the mechanical, optical, and electronic performance of nano-products.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.