GB/T 23364.1-2009

Active

Methods for chemical analysis of high purity indium oxide - Part 1: Determination of arsenic content - Atomic fluorescence spectrometry

高纯氧化铟化学分析方法 第1部分：砷量的测定 原子荧光光谱法

Standard Type
GBT
ICS
77.120
CCS
H66
Status
Active
Issue Date
2009-03-19
Implementation
2010-01-01
Centralized Committee
中国有色金属工业协会
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the atomic fluorescence spectrometry method for determining arsenic content in high-purity indium oxide. It is applied in the metallurgical and electronics industries for quality control and purity assessment of indium oxide used in optoelectronic devices, such as flat-panel displays and solar cells. The method ensures accurate detection of trace arsenic impurities to meet material specifications for semiconductor and optical applications.

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