GB/T 22319.8-2008
ActiveMeasurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
石英晶体元件参数的测量 第8部分：表面贴装石英晶体元件用测量夹具
Application Summary AI generated
This standard specifies the design, performance, and usage requirements for test fixtures used to measure the electrical parameters of surface-mounted quartz crystal units. It is applied in the electronics industry during the manufacturing, quality control, and testing of crystal oscillators and resonators used in compact devices like smartphones, tablets, and communication modules. The standard ensures accurate and repeatable measurements of parameters such as resonance frequency and equivalent circuit values by providing a standardized interface for SMD crystal components.
Related Standards
GB/T 12634-1990
Test methods for electroelastic constants of piezoelectric crystals
GB/T 12633-1990
Terms for the measurements of the properties of the piezoelectric crystals
GB/T 12275-1990
The rule of type designation for quartz crystal oscillators
GB/T 11320-1989
Test methods for the properties of piezoelectric ceramics--Material with the low mechanical quality factor
GB/T 11312-1989
Test methods for SAW properties of piezoelectric ceramics and crystals
GB/T 11311-1989
Test methods for the properties of piezoelectric ceramics--Test for Poisson’s ratio σE
GB/T 11310-1989
Test methods for the properties of piezoelectric ceramics--Test methods for temperature characteristics of relative free dielectric constants
GB/T 11309-1989
Test methods for the properties of piezoelectric ceramics--Quasi-static testfor piezoelectric strain content d33
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.