GB/T 22319.6-2023
ActiveMeasurement of quartz crystal unit parameters—Part 6: Measurement of drive level dependence(DLD)
石英晶体元件参数的测量 第6部分：激励电平相关性(DLD)的测量
Application Summary AI generated
This standard specifies the method for measuring how the resonant frequency and equivalent circuit parameters of quartz crystal units change with varying drive levels. It is applied in the electronics industry for testing and qualifying quartz crystal components used in oscillators, filters, and timing devices, ensuring stable performance under different operating conditions.
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