GB/T 17886.2-1999
ActiveShunt power capacitors of the non-self-healing type for a.c.systems having a rated voltage up to and including 1 kV--Part 2:Ageing test and destruction test
标称电压1 kV及以下交流电力系统用非自愈式并联电容器 第2部分:老化试验和破坏试验
Application Summary AI generated
This standard specifies the ageing and destruction test procedures for non-self-healing shunt power capacitors used in AC power systems with rated voltages up to 1 kV. It is applied by manufacturers and testing laboratories to evaluate the long-term reliability and safety of capacitors under accelerated stress conditions, ensuring they meet performance and failure mode requirements before deployment in low-voltage power networks.
Related Standards
GB/T 5994-2003
Fixed capacitors for use in electronic equipment--Part 4-1:Blank detail specification--Auminium electrolytic capacitors with non-solid electrolyte--Assessment level E
GB/T 5993-2003
Fixed capacitors for use in electronic equipment--Part 4:Sectional specification--Aluminium electrolytic capacitors with solid and non-solid electrolyte
GB/T 7214-2003
Fixed capacitors for use in electronic equipment--Part 15-3:Blank detail specification--Fixed tantalum capacitors with solid electrolyte and porous anode--Assessment level E
GB/T 7213-2003
Fixed capacitors for use in electronic equipment--Part 15:Sectional specification--Fixed tantalum capacitors with non-solid or solid electrolyte
GB/T 12747.1-2004
Shunt power capacitors of the self-healing type for a.c. systems having a rated valtage up to and including 1000V--Part 1:General--Performance，testing and rating--Safety requirements--Guide for installation and operation
GB/T 3984.1-2004
Power capacitors for inductionheating installations--Part 1:General
GB/T 3984.2-2004
Power capacitors for induction heating installations--Part 2:Ageing test，destruction test and requirements for disconnecting internal fuses
GB/T 12747.2-2004
Shunt power capacitors of the self-healing type for a.c.systems having a rated voltage up to and including 1000V--Part 2:Ageing test，self-healing test and destruction test
Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.