GB/T 17865-1999

Active

Specification for measuring depth of focus and best focus

焦深与最佳聚焦的测量规范

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Active
Issue Date
1999-09-13
Implementation
2000-06-01
Centralized Committee
国家标准委
Issuing Authority
国家质量技术监督局

Application Summary AI generated

This standard specifies the measurement methods for determining the depth of focus and best focus position in optical systems, particularly for integrated circuit lithography equipment and photomask inspection tools. It is applied in the semiconductor manufacturing industry to ensure precise image formation and critical dimension control during photolithography processes. The standard provides testing protocols for evaluating the performance of projection lenses and focusing mechanisms in wafer steppers and scanners.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.