GB/T 17864-1999
ActiveCD Metrology procedures
关键尺寸(CD)计量方法
Application Summary AI generated
This standard specifies measurement methods for critical dimensions (CD) in semiconductor manufacturing, such as line widths and feature sizes on integrated circuits. It is applied in the electronics industry for process control and quality assurance during photolithography and etching steps. The procedures ensure accurate and repeatable CD measurements, which are essential for device performance and yield in wafer fabrication facilities.
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