GB/T 17626.20-2014
ActiveElectromagnetic compatibility—Testing and measurement techniques—Emission and immunity testing in transverse electromagnetic (TEM) waveguide
电磁兼容 试验和测量技术 横电磁波（TEM）波导中的发射和抗扰度试验
Application Summary AI generated
GB/T 17626.20-2014 specifies methods for measuring electromagnetic emissions and immunity of electronic devices using transverse electromagnetic (TEM) waveguides. It is applied in EMC testing for small to medium-sized equipment, such as integrated circuits, modules, or low-power devices, within controlled laboratory environments. The standard is particularly relevant for telecommunications, automotive electronics, and consumer electronics industries where repeatable, shielded testing of radiated disturbances is required.
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