GB/T 17473.3-2008

Abolished

Test methods of precious metals pastes used for microelectronics Determination of sheet resistance

微电子技术用贵金属浆料测试方法 方阻测定

Standard Type
GBT
ICS
77.120.99
CCS
H68
Status
Abolished
Issue Date
2008-03-31
Implementation
2008-09-01
Centralized Committee
中国有色金属工业协会
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies a test method for measuring the sheet resistance of precious metal pastes used in microelectronics. It is applied in the manufacturing and quality control of thick-film hybrid circuits, chip resistors, and electrode pastes for electronic components. The method ensures consistent electrical performance of printed conductive layers in microelectronic devices.

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