GB/T 17473.1-2008
AbolishedTest methods of precious metals pastes used for microelectronics-Determination of solids content
微电子技术用贵金属浆料测试方法 固体含量测定
Application Summary AI generated
This standard specifies the method for determining the solids content (non-volatile residue) of precious metal pastes used in microelectronics. It is applied in the manufacturing and quality control of thick-film hybrid circuits, chip resistors, and multilayer ceramic capacitors, where precise paste composition is critical for printing and firing processes. The test ensures consistent material properties for screen-printing applications in electronic component production.
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