GB/T 17444-1998
AbolishedThe technical norms for measurementand test of characteristic parameters of infrared focal plane arrays
红外焦平面阵列特性参数测试技术规范
Application Summary AI generated
This standard specifies the measurement methods and technical requirements for testing characteristic parameters of infrared focal plane arrays, such as responsivity, noise, and detectivity. It is applied in the electronics and optoelectronics industries for quality evaluation and performance verification of infrared detectors used in thermal imaging, surveillance, and scientific instrumentation. The standard ensures consistent testing procedures across research, manufacturing, and procurement contexts.
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