GB/T 15651.4-2017

Active

Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers

半导体器件 分立器件 第5-4部分:光电子器件 半导体激光器

Standard Type
GBT
ICS
31.260
CCS
L51
Status
Active
Issue Date
2017-05-31
Implementation
2017-12-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Application Summary AI generated

This standard specifies the essential ratings, characteristics, and testing methods for semiconductor laser diodes used in discrete optoelectronic devices. It is applied in the design, manufacturing, and quality verification of laser components for fiber-optic communications, optical storage, medical equipment, and industrial sensing systems. The standard ensures consistent performance and reliability benchmarks for engineers and procurement professionals across these industries.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.