GB/T 1550-1997
AbolishedStandard methods for measuring conductivity type of extrinsic semiconducting materials
非本征半导体材料导电类型测试方法
Application Summary AI generated
This standard specifies test methods for determining whether an extrinsic semiconductor material is n-type or p-type. It is applied in the metallurgy and semiconductor industries for quality control and material characterization of silicon, germanium, and other doped semiconducting wafers or ingots. The methods are used during manufacturing and incoming inspection to ensure proper doping polarity for electronic device fabrication.
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