GB/T 14119-1993
ActiveBlankdetail specification for semiconductor inte-grated circuit fusible-link programmable bipolar read-only memories
半导体集成电路双极熔丝式可编程只读存储器空白详细规范(可供认证用)
Application Summary AI generated
This standard specifies the detailed requirements for fusible-link programmable bipolar read-only memories (PROMs) used in semiconductor integrated circuits. It is applied in the electronics industry for the design, testing, and quality certification of these memory devices, ensuring consistent performance in applications such as embedded systems and industrial control. The standard provides a blank detail specification format for manufacturers and certification bodies to verify electrical characteristics, reliability, and programming procedures.
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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.