GB/T 14115-1993

Active

General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits

半导体集成电路采样/保持放大器测试方法的基本原理

Standard Type
GBT
ICS
31.200
CCS
L56
Status
Active
Issue Date
1993-01-21
Implementation
1993-08-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家技术监督局

Application Summary AI generated

This standard specifies the fundamental principles and measurement methods for testing the electrical parameters of sample/hold amplifiers used in semiconductor integrated circuits. It is applied in the design, production, and quality inspection of integrated circuits, particularly in data acquisition systems, analog-to-digital converters, and signal processing applications where precise voltage sampling and holding are required. The standard ensures consistent and reliable testing procedures across manufacturers and testing laboratories.

Related Standards

Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.