GB/T 14032-1992
ActiveGeneral principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
半导体集成电路数字锁相环测试方法的基本原理
Application Summary AI generated
This standard specifies the fundamental principles and methods for measuring the performance parameters of digital phase-locked loops (PLLs) used in semiconductor integrated circuits. It is applied in the testing and evaluation of digital PLLs during the design, manufacturing, and quality assurance phases of electronic products such as communication devices, clock recovery systems, and frequency synthesizers. The standard ensures consistent and reliable measurement practices across the electronics industry for these critical timing and synchronization components.
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