GB/T 14031-1992

Active

General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits

半导体集成电路模拟锁相环测试方法的基本原理

Standard Type
GBT
ICS
31.200
CCS
L55
Status
Active
Issue Date
1992-12-17
Implementation
1993-08-01
Centralized Committee
工业和信息化部(电子)
Issuing Authority
国家技术监督局

Application Summary AI generated

This standard specifies the fundamental principles and measurement methods for testing the electrical parameters of analog phase-locked loops (PLLs) in semiconductor integrated circuits. It is applied in the electronics industry for the design verification, quality assessment, and production testing of PLL-based circuits used in communication systems, frequency synthesis, and signal processing. The standard ensures consistent and reliable evaluation of key performance metrics such as lock range, capture range, and phase noise.

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Transparency note: The application summary and key sentences on this page were automatically generated by AI from the standard's original text. This content has not been human-verified and should not be used for compliance or regulatory purposes. Always refer to the official standard document from the issuing authority.