GB/T 13973-2012
ActiveGeneral specification test methods for semiconductor device curve tracers
半导体管特性图示仪通用规范
Application Summary AI generated
This standard specifies the general technical requirements, test methods, inspection rules, and marking/packaging for semiconductor device curve tracers. It is applied in the manufacturing, calibration, and quality verification of curve tracers used to measure the static characteristic parameters of diodes, transistors, and field-effect transistors in electronics production and laboratory testing.
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