GB/T 12750-2006
ActiveSemiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
半导体器件 集成电路 第11部分：半导体集成电路分规范(不包括混合电路)
Application Summary AI generated
This standard specifies the quality assessment procedures, test methods, and reliability requirements for semiconductor integrated circuits, excluding hybrid circuits. It is applied in the manufacturing and procurement of monolithic ICs, such as microprocessors, memory chips, and logic devices, to ensure consistent performance and reliability in electronic equipment. The standard is used by Chinese manufacturers and testing laboratories for qualification and lot-by-lot inspection of these components.
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